Professor Aurelian CATALIN GALCA

received the Ph.D. Degree from University of Twente, Enschede, the Netherlands in 2006. Currently he is senior researcher rank I and francophone international responsible at National Institute of Materials Physics, Magurele, Romania. He has more than 100 ISI articles, >930 citations (excluding self-citations), h-index=19 ( www.researcherid.com/rid/C-7386-2009 ). The academic output records also one US patent and other several applications. His main scientific expertise is on non-destructive characterization (spectroscopic ellipsometry, X-ray diffraction, Raman Spectroscopy, ultraviolet-visible and infrared spectroscopy) of glasses, ceramics, single crystals, thin films and multilayers. He holds expertise in preparation of thin films by physical vapour deposition methods, the development, structural and optical characterization of thin films and multistructures for integration in various devices such as thin film transistors, photovoltaic cells and memory storage.